Study of Soft X-Ray Yield From NX2 Plasma Focus Using Lee Model Code

Abstract

A Dense Plasma Focus (DPF) is a table top device producing a short-lived very hot plasma and can cause nuclear fusion. Lee Model Code is a computer simulation package, which has been successfully used in studying various PF devices across the world. In the present work we have used the Lee Code to study the neon soft x-ray emitted from the NX2 PF device; which is a four-model Singaporean 3kJ neon PF designed for SXR lithography. Numerical experiments are mainly carried out under various operating pressure of gas with other parameter adjusted to the values of lab. Our objective is to correlate the plasma dynamics and the time periods of the plasma device with some other emission parameters. The NX2 device is operated with 11 kV in the computer simulation package and we compare the computed data with the published measured data. In our study computed values agree with the measured value. The result states that the neon soft x-ray yield is maximum at the pressure of 2.9 Torr and is 22.6 Joule/shot, whereas the maximum value was at 3.31 Torr at the laboratory and measured by Zhang. Computed current curves versus pressure are presented and discussed particularly in terms the dynamic resistance and the computed gross properties are presented and the variation of these plasma dynamics are discussed to explain the maximization of the Y sxr at the optimum pressure. This result obtained is expected to be useful in the area of microlithography, micromachining, materials modi cation and fabrication, imaging and medical and astrophysical simulation together with modelling and computation. Our result agree with the previous work [22] with slight change in other plasma dynamics.